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Chuncheng Wang
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Accurate in situ Measurement of Ellipticity Based on Subcycle Ionization Dynamics
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Indexed by : Journal paper

Document Code : 013203

Date of Publication : 2019-01-09

Journal : PHYSICAL REVIEW LETTERS

Affiliation of Author(s) : Jilin University

Place of Publication : US

Discipline : 理学

Funded by : National Key R&D Program of China、 National Natural Science Foundation of China、

Document Type : J

Volume : 122

Issue : 1

Page Number : 013203-1--013203-5

ISSN : 0031-9007

Abstract : Elliptically polarized laser pulses (EPLPs) are widely applied in
many fields of ultrafast sciences, but theellipticity (ε) has never been in situ measured in the interaction zone of the laser focus. In this Letter, we propose and realize a robust scheme to retrieve the ε by temporally overlapping two identical counterrotating EPLPs. The combined linearly electric field is coherently controlled to ionize Xe atoms by varying the phase delay between the two EPLPs. The electron spectra of the above-threshold ionization and the ion yield are sensitively modulated by the phase delay.

First-Level Discipline : 物理学

Translation or Not : no

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Professor

Gender : Male

Alma Mater : 吉林大学

Education Level : Doctor graduate

Degree : 博士

Status : Employed

School/Department : 原子与分子物理研究所

Business Address : 长春市前进大街2699号理化楼c区

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